JMP for semiconductor process and HW analysis

While JMP provides scripting for automation, I have found the scripting language to be non-obvious at times and the documentation historically for scripting to be inadequate. For these situations, I often turn to Matlab instead.

Since all levels of engineers use it at some level I wish the program would, at times, better protect the user from themselves especially when it comes to determining statisical differences. While program gives all revelant metrics to user so that an educated user can know the qulity of their analysis, the attempt of program to simplify all those metrics into simple visualization can sometime lead the uneducate user into inaccurate conclusions.

With fitting model to complex data, you will often go through many variants of model effect assumptions to attempt to fit data. It would be beneficial if there was better way to coalesce these model fit attempts into a simple summary to more quickly drive to the optimum model.